宜特科技 | 砷化鎵銦微光顯微鏡(InGaAs)
會產生亮點的缺陷 - Junction Leakage; Contact spiking; Hot electrons; Latch-Up; Gate oxide defects / Leakage(F-N current); Poly-silicon filaments; Substrate damage ... 原來就會有的亮點 - Saturated/ Active bipolar transistors; -Saturated MOS/Dynamic CMOS ......