Investigation on seal-ring rules for IC product reliability in 0.25-P m CMOS technology
1314 S.-H. Chen, M.-D. Ker / Microelectronics Reliability 45 (2005) 1311–1316 D1 Distance (Pm) 0 5 10 15 20 25 30 Leakage Current (A) 1e-12 1e-11 1e-10 Without Reliability Stress After HAST Stress After TCT Stress Seal-ring = 10 Pm (a) D1 Distance (Pm) 0 ...