Testing Methods for the Data Retention Time of Deep Trench DRAM and Related Parameters Setting
深溝式DRAM 資料保存時間之測試方法與相關參數之設定 Testing Methods for the Data Retention Time of Deep Trench DRAM and Related Parameters Setting 132 (5) 次臨界漏電 (sub threshold leakage) 與次臨界漏電相關的因素探討如下 [4]:...