High Frequency Noise Characteristics of RF MOSFETs in Subthreshold Region
High Frequency Noise Characteristics of RF MOSFETs in Subthreshold Region Kun-Hin To, Young-Bog Park, Rainer Thoma, William Brown and Margaret W. Huang Digital DNATM Laboratories, Semiconductor Products Sector, Motorola Inc., Tempe AZ 2100 E ......